1. Overview
Developing new materials and products with specific properties and functions requires deep knowledge of materials at the nanoscale.
The Xeuss 3.0 accelerates your research by rapidly providing structural information from the atomic- to nano-scale in your lab when you need it.
The Xeuss 3.0 enables the nanostructure characterization of soft matter and nanomaterials. It allows users to explore a wide range of applications.
With the Xeuss 3.0 you can perform Small- and Wide-Angle X-ray Scattering (SAXS/WAXS) measurements in transmission or in Grazing Incidence (GI-SAXS/WAXS) as well as Ultra-SAXS measurements to provide comprehensive structural information on all types of samples.
The Xeuss 3.0 is the perfect tool to make your lab a multi-user research center platform and initiate new collaborations.
Typical measurements with the Xeuss 3.0 include:
1.Particle size distribution ranging from a few nanometers
to more than 300 nm in diameter (or up to few microns
with USAXS)
2.Crystallization rates and lamellar structure of semicrystalline polymers
3.Size and shape analysis of surfactants or proteins and
other macromolecules in solutions
4.Organization and orientation of nanomaterials at the
atomic- or the nano-scale, in bulk or at surfaces
5.Phase segregation studies of alloys
6. Operando and in situ studies
See more on www.xenocs.com/characterization/
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